德國MiniTest 740塗層測厚儀
德國 MiniTest 740 塗層測厚儀 / German MiniTest 740 Coating Thickness Gauge .jpg)
已被德國 MiniTest 745 塗層測厚儀取代 / Replaced by MiniTest 745
產品簡介 / Product Overview
MiniTest 740 是一款高靈活性塗層測厚儀，適用於品質管控與檢測。所有 740 系列探頭可透過延長線連接或直接插入主機，方便單手操作。
MiniTest 740 is a highly flexible coating thickness gauge designed for quality control and inspection. All 740 series probes can be connected via extension cable or inserted directly into the gauge for easy one-handed operation.
MiniTest 700 系列專為高精度塗層測量設計，適用於汽車、造船、鋼鐵、橋樑、家電等行業，確保產品外觀與品質。
The MiniTest 700 series provides reliable and accurate coating thickness measurement, ideal for automotive, shipbuilding, steel, bridge construction, appliances, and other industries, ensuring product quality and finish.
符合人體工學設計，圓形外觀適合掌握，具測量速度設定功能，可依需求選擇高速或高精度模式。
Ergonomically designed with a rounded shape to fit the hand. Features adjustable measuring speed for quick measurements or high-accuracy readings as needed.
搭載 SIDSP® 技術（Sensor-Integrated Digital Signal Processing），在探頭內即完成數位信號處理，確保極高準度與重複性。
Equipped with SIDSP® technology (Sensor-Integrated Digital Signal Processing) to process signals digitally within the probe, ensuring maximum accuracy and repeatability.
應用說明 / Application Principle
F 型、N 型及 FN 型探頭可自動補償基材導電性與不規則表面形狀，適用各種塗層材料與厚度。
F, N, and FN probes automatically compensate for substrate conductivity and irregular surfaces, suitable for various coating materials and thicknesses.
產品特點 / Features
• 可透過延長線或直接插入主機的單手操作探頭。
740 series probes connect via extension cable or directly into the gauge for one-handed operation.
• 探頭可互換，適用塗層厚度最高達 600 mils。
Interchangeable probes suitable for coatings up to 600 mils.
• 支援探頭與主機韌體更新。
Downloadable probe and gauge firmware updates.
• FN 探頭自動識別基材。
Automatic substrate identification with FN probes.
• 具聲光警示（紅/綠 LED）。
Audible and visual (red/green LED) alarms.
• 探頭溫度補償，確保精準測量。
All probes are temperature compensated for accurate measurements.
• 大型背光圖形顯示，可旋轉 180°。
Large backlit graphical display, rotatable 180°.
• 記憶容量大，可存 100,000 筆資料，分 100 批次管理。
Large memory capacity: 100,000 readings in 100 batches.
• 標準、零點、2 點、3 點及粗糙度校正模式。
Factory set, zero, 2-point, 3-point, and roughness calibration modes.
• 支援國際標準 SSPC-PA2、ISO、Swedish (SS 18 41 60)、Australian (AS 3894.3)、ISO 19840、ASTM D7091。
Supports international standards: SSPC-PA2, ISO, Swedish (SS 18 41 60), Australian (AS 3894.3), ISO 19840, ASTM D7091.
• 使用者導向選單操作，提供 25 種語言。
Easy menu-guided operation, available in 25 languages.
• 內建 IrDA 紅外傳輸接口，可連接印表機或 PC。
Built-in IrDA port for infrared data transmission to printer or PC.
技術參數 / Specifications
| 項目 / Item | 規格 / Specification |
|---|---|
| 測量範圍 / Measuring Range | F1.5, N0.7, FN1.5: 0 - 1.5 mm / F2 HD: 0 - 0.7 mm / F5, N2.5, FN5: 0 - 2 mm / F15: 0 - 5 mm / F1.5-90, N07-90, FN1.5-90: 0 - 15 mm |
| 測量方式 / Measuring Principle | F: 磁感應 / Magnetic induction; N: 渦流 / Eddy current; FN: 磁感應 / Magnetic induction |
| 精度 / Accuracy | ± (1 µm + 0.75% 閱讀值) 至 ± (5 µm + 0.75% 閱讀值) |
| 重複性 / Repeatability | ± (0.5 µm + 0.5% 閱讀值) 至 ± (2.5 µm + 0.5% 閱讀值) |
| 最低曲面半徑 / Minimum Curvature Radius | 凸面 1 - 5 mm / 凹面 5 - 30 mm |
| 最低測量面積 / Minimum Measuring Area | ⌀ 5 - 25 mm |
| 最低基材厚度 / Minimum Substrate Thickness | 0.3 - 1 mm |
| 解析度 / Resolution | 0.05 - 1 µm |
| 測量速度 / Measuring Rate | 20 readings/sec (continuous) / 70 readings/min (single) |
| 操作溫度 / Operating Temperature | –10°C ~ 60°C |
| 儲存溫度 / Storage Temperature | –20°C ~ 70°C |
| 防護等級 / Protection | IP40 |
| 電源 / Power Supply | 2 x AA 或充電式 NiMH AA/HR6 |
| 標準 / Standards | DIN EN ISO 1461, 2064, 2178, 2360, 2808, 3882, 19840, ASTM B244, B499, D7091, E376, AS 3894.3, SS 1841 60, SSPC-PA2 |
標配內容 / Standard Package
• MiniTest 740 主機 / MiniTest 740 gauge
• SIDSP® 探頭 / SIDSP® sensor (user selected)
• 軟質收納袋 / Soft pouch
• 校準組（校準標準片、零點片） / Calibration set with standards and zero reference plate(s)
• 軟體光碟 / Software CD
• 校準證書 / Calibration certificate
• 操作手冊（德語、英語、法語、西班牙語） / Instruction manual (DE, EN, FR, ES)
• 電池組 / 2 x AA (base unit), 2 x AA (probe)
探頭型號對照表 / Probe Model Comparison
| 型號 / Model | 測量範圍 / Measuring Range | 測量原理 / Measuring Principle | 適用塗層 / Typical Application | 精度 / Accuracy | 重複性 / Repeatability | 最小曲面半徑凸 / Min Curvature Radius Convex | 最小曲面半徑凹 / Min Curvature Radius Concave | 最小測量面積 / Min Measuring Area | 最小基材厚度 / Min Substrate Thickness |
|---|---|---|---|---|---|---|---|---|---|
| F1.5 | 0 – 1.5 mm | 磁感應 / Magnetic Induction | 小樣品，薄塗層 / Small samples, thin coatings | ±(1 µm + 0.75% 讀值 / reading) | ±(0.5 µm + 0.5% 讀值 / reading) | 1.0 mm | 7.5 mm | ⌀5 mm | 0.3 mm |
| N0.7 | 0 – 0.7 mm | 渦電流 / Eddy Current | 小樣品，薄塗層 / Small samples, thin coatings | ±(1.5 µm + 0.75% 讀值 / reading) | ±(0.8 µm + 0.5% 讀值 / reading) | 1.5 mm | 10 mm | ⌀10 mm | 40 µm |
| FN1.5 | 0 – 2 mm | 磁感應 / Magnetic Induction | 小樣品，薄塗層 / Small samples, thin coatings | ±(5 µm + 0.75% 讀值 / reading) | ±(2.5 µm + 0.5% 讀值 / reading) | 5 mm | 25 mm | ⌀25 mm | 0.5 mm |
| F2 HD | 0 – 5 mm | 磁感應 / Magnetic Induction | 粗糙表面 / Rough surfaces | ±(1 µm + 0.75% 讀值 / reading) | ±(0.5 µm + 0.5% 讀值 / reading) | 5 mm | 5 mm | ⌀5 mm | 0.5 mm |
| F5 | 0 – 15 mm | 磁感應 / Magnetic Induction | 厚塗層 / Thick coatings | ±(1 µm + 0.75% 讀值 / reading) | ±(0.5 µm + 0.5% 讀值 / reading) | 5 mm | 5 mm | ⌀5 mm | 1 mm |
| N2.5 | 0 – 2.5 mm | 渦電流 / Eddy Current | 厚塗層 / Thick coatings | ±(1 µm + 0.75% 讀值 / reading) | ±(0.5 µm + 0.5% 讀值 / reading) | 5 mm | 5 mm | ⌀5 mm | 40 µm |
| FN5 | 0 – 15 mm | 磁感應 / Magnetic Induction | 厚塗層 / Thick coatings | ±(1 µm + 0.75% 讀值 / reading) | ±(0.5 µm + 0.5% 讀值 / reading) | 5 mm | 5 mm | ⌀5 mm | 1 mm |
| F1.5-90 | 0 – 0.7 mm | 磁感應 / Magnetic Induction | 管件及難以接觸之物件 / Tubes & hard-to-reach objects | ±(1 µm + 0.75% 讀值 / reading) | ±(0.5 µm + 0.5% 讀值 / reading) | 1.0 mm | 7.5 mm | ⌀5 mm | 40 µm |
| N0.7-90 | 0 – 0.7 mm | 渦電流 / Eddy Current | 管件及難以接觸之物件 / Tubes & hard-to-reach objects | ±(1.5 µm + 0.75% 讀值 / reading) | ±(0.8 µm + 0.5% 讀值 / reading) | 1.5 mm | 10 mm | ⌀10 mm | 40 µm |
| FN1.5-90 | 0 – 2 mm | 磁感應 / Magnetic Induction | 管件及難以接觸之物件 / Tubes & hard-to-reach objects | ±(5 µm + 0.75% 讀值 / reading) | ±(2.5 µm + 0.5% 讀值 / reading) | 5 mm | 25 mm | ⌀25 mm | 0.5 mm |
